Nanotechnology SEMContact Person: Igal Avram

SEM TEM DualBeam FIB MICRO / NANO Analasys Accessories	Scanning Electron Microscopes (SEM) Scanning Electron Microscopes (SEM) are used for inspecting topographies of materials with a magnification range that encompasses that of optical microscopy and extends it to the nanoscale. FEI offers a variety of advanced SEMs to meet customer requirements and application needs. read more